Substrate temperature dependent physical properties of SnS1−xSex thin films
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چکیده
منابع مشابه
OPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...
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چکیده ندارد.
15 صفحه اولPhysical Properties of Reactively Sputter-Deposited C-N Thin Films
This work aims to prepare and study amorphous carbon nitride (CNx) films. Films were deposited by reactive magnetron radiofrequency (RF) sputtering from graphite target in argon and nitrogen mixture discharge at room temperature. The ratio of the gas flow rate was varied from 0.1 to 1. Deposited films were found to be amorphous. Highest Nitrogen concentration achieved was 42 atomic percent whic...
متن کاملDependence of Nanostructure and the Optical Properties of Ni Thin Films with Different Thicknesses on the Substrate Temperature
Nickel films with the thicknesses of 30 and 120 nm were deposited on glass substrates, at different substrate temperatures (313 to 600 K) under uhv condition. The nano-structure of the films and mean diameter of grains was obtained for each films using atomic force microscopy (AFM). Their optical properties were measured by spectrophotometry in the spectral range of 190-2500 nm. Kramers-Kronig ...
متن کاملoptical properties of thin cu films as a function of substrate temperature
copper films (250 nm) deposited on glass substrates, at different substrate temperatures. their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. kramers kronig method was used for the analysis of the reflectivity curves of cu films to obtain the optical constants of the films, while ellipsometery measu...
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ژورنال
عنوان ژورنال: Applied Physics A
سال: 2019
ISSN: 0947-8396,1432-0630
DOI: 10.1007/s00339-019-3003-0